Highly ionizing particles (HIPs) created by nuclear interactions in the silicon sensors cause a large signal which can saturate the APV readout chip used in the CMS Silicon Tracker system. This phenomenon was studied in two different beam-tests performed at PSI and at the CERN X5 experimental areas in 2002. The probability of a HIP-like event to occur per incident pion was measured and the dependence of the APV capability to detect a MIP signal on the time required to recover from such an event is derived. From these results, the expected inefficiency of the CMS Tracker due to HIPS is inferred.

Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker / De Filippis, Nicola. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 530:1-2(2004), pp. 50-53. (Intervento presentato al convegno 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor De tenutosi a Firenze, Italy nel September 29 - October 1, 2003) [10.1016/j.nima.2004.05.046].

Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker

De Filippis, Nicola
2004-01-01

Abstract

Highly ionizing particles (HIPs) created by nuclear interactions in the silicon sensors cause a large signal which can saturate the APV readout chip used in the CMS Silicon Tracker system. This phenomenon was studied in two different beam-tests performed at PSI and at the CERN X5 experimental areas in 2002. The probability of a HIP-like event to occur per incident pion was measured and the dependence of the APV capability to detect a MIP signal on the time required to recover from such an event is derived. From these results, the expected inefficiency of the CMS Tracker due to HIPS is inferred.
2004
6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor De
Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker / De Filippis, Nicola. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 530:1-2(2004), pp. 50-53. (Intervento presentato al convegno 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor De tenutosi a Firenze, Italy nel September 29 - October 1, 2003) [10.1016/j.nima.2004.05.046].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/14343
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