A new solution to improve the testability of high resolution SigmaDelta Analogue to Digital Converters (SigmaDeltaADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.
New test access for high resolution Sigma Delta ADC's by using the noise transfer function evaluation / De Venuto, Daniela. - STAMPA. - (2004), pp. 81-85. (Intervento presentato al convegno 5th International Symposium on Quality Electronic Design, ISQUED 2004 tenutosi a San Jose, CA nel March 22-24, 2004) [10.1109/ISQED.2004.1283654].
New test access for high resolution Sigma Delta ADC's by using the noise transfer function evaluation
De Venuto, Daniela
2004-01-01
Abstract
A new solution to improve the testability of high resolution SigmaDelta Analogue to Digital Converters (SigmaDeltaADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
