The paper gives formulae for evaluating the uncertainty of measurements (both ‘‘direct’’ and ‘‘indirect’’) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The formulae allow one to evaluate the measurement uncertainty with any given level of confidence, including the special case (when applicable) of 100% or ‘‘worst-case’’ uncertainty. The results are intended as a contribution towards a standard way of writing and using ADC specifications.
Worst-case Uncertainty Measurement in ADC-based Instruments / Attivissimo, Filippo; Giaquinto, Nicola; Savino, Mario. - In: COMPUTER STANDARDS & INTERFACES. - ISSN 0920-5489. - 29:1(2007), pp. 5-10. [10.1016/j.csi.2005.12.002]
Worst-case Uncertainty Measurement in ADC-based Instruments
ATTIVISSIMO, Filippo;GIAQUINTO, Nicola;SAVINO, Mario
2007-01-01
Abstract
The paper gives formulae for evaluating the uncertainty of measurements (both ‘‘direct’’ and ‘‘indirect’’) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The formulae allow one to evaluate the measurement uncertainty with any given level of confidence, including the special case (when applicable) of 100% or ‘‘worst-case’’ uncertainty. The results are intended as a contribution towards a standard way of writing and using ADC specifications.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.