Electron-impact cross sections are calculated for the v -> v' transitions occurring between the vibrational levels of the two X-2 Sigma(+) and A(2)Pi electronic states of the BeH molecule. The calculations are performed with the R-matrix method for a purely vertical electronic transition for energies from threshold to 15 eV, and by using a modified version of the Mott and Masssey approximation to extend the calculations to high energies and to vibrational excitations. Rate coefficients are also calculated for the same transitions. The calculated v-v' selective cross sections and rate coefficients both satisfy distinct scaling relationships, which can be represented in a simple analytic form

Electron-impact state-to-state resolved cross sections and rate coefficients for the X(v) → A(v') excitation in BeH molecules / Celiberto, Roberto; Baluja, K. L.; Janev, R. K.. - In: PLASMA SOURCES SCIENCE & TECHNOLOGY. - ISSN 0963-0252. - 22:1(2013). [10.1088/0963-0252/22/1/015008]

Electron-impact state-to-state resolved cross sections and rate coefficients for the X(v) → A(v') excitation in BeH molecules

CELIBERTO, Roberto;
2013-01-01

Abstract

Electron-impact cross sections are calculated for the v -> v' transitions occurring between the vibrational levels of the two X-2 Sigma(+) and A(2)Pi electronic states of the BeH molecule. The calculations are performed with the R-matrix method for a purely vertical electronic transition for energies from threshold to 15 eV, and by using a modified version of the Mott and Masssey approximation to extend the calculations to high energies and to vibrational excitations. Rate coefficients are also calculated for the same transitions. The calculated v-v' selective cross sections and rate coefficients both satisfy distinct scaling relationships, which can be represented in a simple analytic form
2013
Electron-impact state-to-state resolved cross sections and rate coefficients for the X(v) → A(v') excitation in BeH molecules / Celiberto, Roberto; Baluja, K. L.; Janev, R. K.. - In: PLASMA SOURCES SCIENCE & TECHNOLOGY. - ISSN 0963-0252. - 22:1(2013). [10.1088/0963-0252/22/1/015008]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/780
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