The influence of high energy radiations on the performance of silicon-on-insulator photonic devices, such as straight waveguides, ring resonators and Raman lasers based on resonant microcavities, has been investigated theoretically in the near infrared. The modeling is based on a generalized full-vectorial wave equation system which also includes deep defect rate equations. Simulation results are compared with the state-of-the-art, demonstrating a very good agreement between theoretical predictions and experiments reported in literature in the case of both ionizing and nonionizing events. Moreover, a parametric analysis is presented in order to investigate the degradation mechanisms of photonic device performance that occur under the influence of radiation bombardment.

Modeling of Radiation Effects in Silicon Photonic Devices / DE LEONARDIS, Francesco; Troia, B.; Campanella, C. E.; Prudenzano, Francesco; Passaro, Vittorio. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 62:5(2015), pp. 2155-2168. [10.1109/TNS.2015.2469671]

Modeling of Radiation Effects in Silicon Photonic Devices

DE LEONARDIS, Francesco;PRUDENZANO, Francesco;PASSARO, Vittorio
2015-01-01

Abstract

The influence of high energy radiations on the performance of silicon-on-insulator photonic devices, such as straight waveguides, ring resonators and Raman lasers based on resonant microcavities, has been investigated theoretically in the near infrared. The modeling is based on a generalized full-vectorial wave equation system which also includes deep defect rate equations. Simulation results are compared with the state-of-the-art, demonstrating a very good agreement between theoretical predictions and experiments reported in literature in the case of both ionizing and nonionizing events. Moreover, a parametric analysis is presented in order to investigate the degradation mechanisms of photonic device performance that occur under the influence of radiation bombardment.
2015
Modeling of Radiation Effects in Silicon Photonic Devices / DE LEONARDIS, Francesco; Troia, B.; Campanella, C. E.; Prudenzano, Francesco; Passaro, Vittorio. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 62:5(2015), pp. 2155-2168. [10.1109/TNS.2015.2469671]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/896
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