Substrate coupling is a phenomenon that affects the behavior and performance of RF and mixed signal ICs. Prediction of such crosstalk during the design process can help designers. In this paper, a new methodology is presented for performing a fast and reliable characterization of the noise transmission path, modeling the substrate as a resistive network. Adopting only DC measurement techniques, the dependence of disturbances attenuation on the geometric parameters is found. Moreover, the relation between attenuation and disturbance types is indicated. Finally, a qualitative comparison is made between the efficiency of the most commonly used technology measures against substrate crosstalk.
Evaluation of Technology Options for Substrate noise reduction / Rizzi, M.; Castagnolo, B.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 14:1(2005), pp. 27-50. [10.1142/S0218126605002167]
Evaluation of Technology Options for Substrate noise reduction
Rizzi, M.;Castagnolo, B.
2005-01-01
Abstract
Substrate coupling is a phenomenon that affects the behavior and performance of RF and mixed signal ICs. Prediction of such crosstalk during the design process can help designers. In this paper, a new methodology is presented for performing a fast and reliable characterization of the noise transmission path, modeling the substrate as a resistive network. Adopting only DC measurement techniques, the dependence of disturbances attenuation on the geometric parameters is found. Moreover, the relation between attenuation and disturbance types is indicated. Finally, a qualitative comparison is made between the efficiency of the most commonly used technology measures against substrate crosstalk.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
