This paper describes a readout ASIC prototype designed by the CHIPIX65 project, part of RD53, for a pixel detector at HL-LHC . A 64Ã64 matrix of 50Ã50μm2pixels is realised. A digital architecture has been developed, with particle efficiency above 99.5% at 3 GHz/cm2pixel rate, trigger frequency of 1 MHz and 12.5μsec latency. Two analog front end designs, one synchronous and one asynchronous, are implemented. Charge is measured with 5-bit precision, analog dead-time below 1%. The chip integrates for the first time many of the components developed by the collaboration in the past, including the Digital-to-Analog converters, Bandgap reference, Serializer, sLVS drivers, and analog Front Ends. Irradiation tests on these components proved their reliability up to 600 Mrad.
A prototype of pixel readout ASIC in 65 nm CMOS technology for extreme hit rate detectors at HL-LHC / Paternò, A.; Pacher, L.; Monteil, E.; Loddo, F.; Demaria, N.; Gaioni, L.; De Canio, F.; Traversi, G.; Re, V.; Ratti, L.; Rivetti, A.; Da Rocha Rolo, M.; Dellacasa, G.; Mazza, G.; Marzocca, C.; Licciulli, F.; Ciciriello, F.; Marconi, S.; Placidi, P.; Magazzu, G.; Stabile, A.; Mattiazzo, S.; Veri, C.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 12:2(2017). [10.1088/1748-0221/12/02/C02043]
A prototype of pixel readout ASIC in 65 nm CMOS technology for extreme hit rate detectors at HL-LHC
Marzocca, C.;Licciulli, F.;Ciciriello, F.;
2017-01-01
Abstract
This paper describes a readout ASIC prototype designed by the CHIPIX65 project, part of RD53, for a pixel detector at HL-LHC . A 64Ã64 matrix of 50Ã50μm2pixels is realised. A digital architecture has been developed, with particle efficiency above 99.5% at 3 GHz/cm2pixel rate, trigger frequency of 1 MHz and 12.5μsec latency. Two analog front end designs, one synchronous and one asynchronous, are implemented. Charge is measured with 5-bit precision, analog dead-time below 1%. The chip integrates for the first time many of the components developed by the collaboration in the past, including the Digital-to-Analog converters, Bandgap reference, Serializer, sLVS drivers, and analog Front Ends. Irradiation tests on these components proved their reliability up to 600 Mrad.| File | Dimensione | Formato | |
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