Interferometer sensors using optical waveguides have been shown to be suitable for sensing a variety of physical items such as temperature, strain, humidity, electric and magnetic fields, position. In this paper we study an integrated optical microdisplacement sensor making use of a Michelson interferometric configuration. The two-beam semi-asymmetric X junction is composed of four single-mode Ti diffused LiNbO3 channel waveguides at λ = 633 nm. The design criteria stress the fact that the waveguide runs at a given angle with respect to the principal reference system. The electromagnetic field evolution is obtained both by mode-matching and beam propagation methods.

Design criteria of an integrated optics microdisplacement sensor

Marco De Sario;Antonella D'Orazio;Vincenzo Petruzzelli
1990

Abstract

Interferometer sensors using optical waveguides have been shown to be suitable for sensing a variety of physical items such as temperature, strain, humidity, electric and magnetic fields, position. In this paper we study an integrated optical microdisplacement sensor making use of a Michelson interferometric configuration. The two-beam semi-asymmetric X junction is composed of four single-mode Ti diffused LiNbO3 channel waveguides at λ = 633 nm. The design criteria stress the fact that the waveguide runs at a given angle with respect to the principal reference system. The electromagnetic field evolution is obtained both by mode-matching and beam propagation methods.
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
0-8194-0393-8
Society of Photo-Optical Instrumentation Engineers
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11589/11923
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