Interferometer sensors using optical waveguides have been shown to be suitable for sensing a variety of physical items such as temperature, strain, humidity, electric and magnetic fields, position. In this paper we study an integrated optical microdisplacement sensor making use of a Michelson interferometric configuration. The two-beam semi-asymmetric X junction is composed of four single-mode Ti diffused LiNbO3 channel waveguides at λ = 633 nm. The design criteria stress the fact that the waveguide runs at a given angle with respect to the principal reference system. The electromagnetic field evolution is obtained both by mode-matching and beam propagation methods.
|Titolo:||Design criteria of an integrated optics microdisplacement sensor|
|Titolo del libro:||Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection|
|Editore:||Society of Photo-Optical Instrumentation Engineers|
|Data di pubblicazione:||1990|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1117/12.51105|
|Appare nelle tipologie:||2.1 Contributo in volume (Capitolo o Saggio)|