Interferometric optical sensors have been shown to possess very high resolution due to the sensitivity of the optical path length to a variety of electrical, chemical and mechanical quantities. We present the design of an integrated optic microdisplacement sensor made of four single mode Ti:LiNbO3 channel waveguides on X-cut substrate shaped to form a semi-asymmetric X junction. The effects of the rotation of the waveguide axis with respect to the principal reference coordinate system and the influence of the fluctuations in the environment temperature have been accounted. The calculated effective index change is dnef/dT = 17.10-5oC-1 for EY-11 mode and dnef/dT = 5.3 .10-5 ° C-1 for Ex11 mode, respectively.
|Titolo:||Integrated optics displacement sensor|
|Titolo del libro:||Fiber Optics Reliability: Benign and Adverse Environments IV|
|Nome editore:||Society of Photo-Optical Instrumentation Engineers|
|Data di pubblicazione:||1991|
|Digital Object Identifier (DOI):||10.1117/12.24708|
|Appare nelle tipologie:||2.1 Contributo in volume (Capitolo o Saggio)|