The resolution of a sensor designed to measure strain may be compromised by fluctuations in the environment temperature. This problem can be solved by considering a combined interferometnic-polanimetric measure: in fact if both the interferometric phases for the TE-like and TM-like polarizations are determined the solution of a system of two equations allows for the simultaneous recovery of strain and temperature. In this paper we discuss the possibility of making unambiguous measurements by using the integrated-optic Michelson interferometer consisting of a semi-asymmetric Xjunction made by titanium indiffused lithium niobate waveguides designed and built specifically for the stress temperature and microdisplacement measurements.