The resolution of a sensor designed to measure strain may be compromised by fluctuations in the environment temperature. This problem can be solved by considering a combined interferometnic-polanimetric measure: in fact if both the interferometric phases for the TE-like and TM-like polarizations are determined the solution of a system of two equations allows for the simultaneous recovery of strain and temperature. In this paper we discuss the possibility of making unambiguous measurements by using the integrated-optic Michelson interferometer consisting of a semi-asymmetric Xjunction made by titanium indiffused lithium niobate waveguides designed and built specifically for the stress temperature and microdisplacement measurements.
Design of a Ti:LiNbO3 Sensor for the Simultaneous measurement of stress and temperature / S., Cucurachi; D'Orazio, Antonella; M., DE SARIO; Petruzzelli, Vincenzo; Prudenzano, Francesco. - STAMPA. - 2101:(1993), pp. 340-347. (Intervento presentato al convegno 2nd International Symposium on Measurement Technology and Intelligent Instruments tenutosi a Wuhan, China nel 29 October-5 November 1993) [10.1117/12.156460].
Design of a Ti:LiNbO3 Sensor for the Simultaneous measurement of stress and temperature
D'ORAZIO, Antonella;PETRUZZELLI, Vincenzo;PRUDENZANO, Francesco
1993-01-01
Abstract
The resolution of a sensor designed to measure strain may be compromised by fluctuations in the environment temperature. This problem can be solved by considering a combined interferometnic-polanimetric measure: in fact if both the interferometric phases for the TE-like and TM-like polarizations are determined the solution of a system of two equations allows for the simultaneous recovery of strain and temperature. In this paper we discuss the possibility of making unambiguous measurements by using the integrated-optic Michelson interferometer consisting of a semi-asymmetric Xjunction made by titanium indiffused lithium niobate waveguides designed and built specifically for the stress temperature and microdisplacement measurements.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
