The paper examines the problem of achieving a fast measurement of nonlinearity for a dithered converter. It is shown that, since dither removes small-scale systematic errors, measuring the remaining large-scale (smooth) nonlinearity can be efficiently achieved via a fast frequency domain test, formerly analyzed by the authors for conventional converters without dither. The test appears especially suited for dithered converters, and can be useful for the periodic adjustment of a look-up table intended for removing large-scale nonlinearities.
|Titolo:||Frequency domain analysis for integral nonlinearity measurement in A/D converters with dither|
|Data di pubblicazione:||2001|
|Nome del convegno:||IMEKO TC4 Symposium 2001|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|