The paper gives formulae for evaluating the uncertainty of measurements (both “direct” and “indirect”, i.e. functions of measurements) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The mathematically complex but nowadays common technique of dithering is also analyzed. The results are intended as a contribution towards a standard way of writing and using ADC specifications.
|Autori interni:||SAVINO, Mario|
|Titolo:||Evaluating Measurement Uncertainty in A/D Converters with and without Dither|
|Data di pubblicazione:||2003|
|Nome del convegno:||8th International Workshop on ADC Modelling and Testing (IWADC 03)|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|