The paper gives formulae for evaluating the uncertainty of measurements (both “direct” and “indirect”, i.e. functions of measurements) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The mathematically complex but nowadays common technique of dithering is also analyzed. The results are intended as a contribution towards a standard way of writing and using ADC specifications.
Evaluating Measurement Uncertainty in A/D Converters with and without Dither / Attivissimo, F; Giaquinto, N; Savino, M. - ELETTRONICO. - (2003). (Intervento presentato al convegno 8th International Workshop on ADC Modelling and Testing, IWADC 2003 tenutosi a Perugia, Italy nel September 8-10, 2003).
Evaluating Measurement Uncertainty in A/D Converters with and without Dither
Attivissimo F;Giaquinto N;Savino M
2003-01-01
Abstract
The paper gives formulae for evaluating the uncertainty of measurements (both “direct” and “indirect”, i.e. functions of measurements) performed through an ADC-based device (like an oscilloscope, a plug-in DAQ board, etc.). The way of modeling the errors and writing the specifications is discussed. The mathematically complex but nowadays common technique of dithering is also analyzed. The results are intended as a contribution towards a standard way of writing and using ADC specifications.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
