In this paper formulae for evaluating the uncertainty of measurements (direct and indirect) performed by means of an ADC-based device are presented. The complex technique of dithering is used to reduce the effect of noise and to increase the ADC resolution. The authors discuss a way of writing and interpreting the uncertainty specifications of ADCs.
Uncertainty Evaluation in Dithered A/D Converters / Attivissimo, Filippo; Giaquinto, Nicola; Savino, Mario. - (2004), pp. 121-124. (Intervento presentato al convegno 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004 tenutosi a Saint Petersburg, Russia nel 30 June-2 July 2004).
Uncertainty Evaluation in Dithered A/D Converters
ATTIVISSIMO, Filippo;GIAQUINTO, Nicola;SAVINO, Mario
2004-01-01
Abstract
In this paper formulae for evaluating the uncertainty of measurements (direct and indirect) performed by means of an ADC-based device are presented. The complex technique of dithering is used to reduce the effect of noise and to increase the ADC resolution. The authors discuss a way of writing and interpreting the uncertainty specifications of ADCs.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
