At terahertz (THz) frequencies, scattering-type scanning near-field optical microscopy (s-SNOM) based on continuous wave sources mostly relies on cryogenic and bulky detectors, which represents a major constraint for its practical application. Here, we devise a THz s-SNOM system that provides both amplitude and phase contrast and achieves nanoscale (60-70nm) in-plane spatial resolution. It features a quantum cascade laser that simultaneously emits THz frequency light and senses the backscattered optical field through a voltage modulation induced inherently through the self-mixing technique. We demonstrate its performance by probing a phonon-polariton-resonant CsBr crystal and doped black phosphorus flakes.

Phase-resolved terahertz self-detection near-field microscopy / Giordano, Maria C.; Mastel, Stefan; Liewald, Clemens; Columbo, Lorenzo L.; Brambilla, Massimo; Viti, Leonardo; Politano, Antonio; Zhang, Kai; Li, Lianhe; Giles Davies, A.; Linfield, Edmund H.; Hillenbrand, Rainer; Keilmann, Fritz; Scamarcio, Gaetano; Vitiello, Miriam S.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 26:14(2018), pp. 18423-18435. [10.1364/OE.26.018423]

Phase-resolved terahertz self-detection near-field microscopy

Brambilla, Massimo;
2018-01-01

Abstract

At terahertz (THz) frequencies, scattering-type scanning near-field optical microscopy (s-SNOM) based on continuous wave sources mostly relies on cryogenic and bulky detectors, which represents a major constraint for its practical application. Here, we devise a THz s-SNOM system that provides both amplitude and phase contrast and achieves nanoscale (60-70nm) in-plane spatial resolution. It features a quantum cascade laser that simultaneously emits THz frequency light and senses the backscattered optical field through a voltage modulation induced inherently through the self-mixing technique. We demonstrate its performance by probing a phonon-polariton-resonant CsBr crystal and doped black phosphorus flakes.
2018
https://www.osapublishing.org/oe/abstract.cfm?uri=oe-26-14-18423
Phase-resolved terahertz self-detection near-field microscopy / Giordano, Maria C.; Mastel, Stefan; Liewald, Clemens; Columbo, Lorenzo L.; Brambilla, Massimo; Viti, Leonardo; Politano, Antonio; Zhang, Kai; Li, Lianhe; Giles Davies, A.; Linfield, Edmund H.; Hillenbrand, Rainer; Keilmann, Fritz; Scamarcio, Gaetano; Vitiello, Miriam S.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 26:14(2018), pp. 18423-18435. [10.1364/OE.26.018423]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/149182
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