We report the results of two beam tests performed in July and September 1995 at CERN using silicon microstrip detectors of various types: single sided, double sided with small-angle stereo strips, double sided with orthogonal strips, double sided with pads. For the read-out electronics, use was made of Preshape32 Premux128 and VA1 chips. The signal-to-noise ratio and the resolution of the detectors was studied at different incident angles of the incoming particles and for different values of the detector bias voltage. The goal of these tests was to check and improve the performances of the prototypes for the CMS Central Detector.
|Titolo:||Beam test results for single- and double-sided silicon detector prototypes of the CMS central detector|
|Data di pubblicazione:||1997|
|Digital Object Identifier (DOI):||10.1016/S0168-9002(97)00750-X|
|Appare nelle tipologie:||1.1 Articolo in rivista|