A fully digital test stimuli generation and on-chip specifications evaluation for cheap, fast, though accurate testing of high resolution ΣΔ ADCs are here presented. Simulations and measurements showed a discrimination threshold on specification parameters up to -90dBc. The proposed method helps reduce the cost of ADC production test, to extend test coverage and to enable Built-In Self-Test and test-based self-calibration.
PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs / DE VENUTO, Daniela; Reyneri, L.. - (2008), pp. 284-287. (Intervento presentato al convegno DATE 2008, International Conference Design and Automation in Europe tenutosi a Munich (D)) [10.1109/DATE.2008.4484899].
PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs
DE VENUTO, Daniela;
2008-01-01
Abstract
A fully digital test stimuli generation and on-chip specifications evaluation for cheap, fast, though accurate testing of high resolution ΣΔ ADCs are here presented. Simulations and measurements showed a discrimination threshold on specification parameters up to -90dBc. The proposed method helps reduce the cost of ADC production test, to extend test coverage and to enable Built-In Self-Test and test-based self-calibration.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
