A new solution to improve the testability of high resolution SigmaDelta Analogue to Digital Converters (SigmaDeltaADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.

New test access for high resolution Sigma Delta ADC's by using the noise transfer function evaluation

De Venuto, Daniela
2004

Abstract

A new solution to improve the testability of high resolution SigmaDelta Analogue to Digital Converters (SigmaDeltaADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.
5th International Symposium on Quality Electronic Design, ISQUED 2004
0-7695-2093-6
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11589/15793
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