In this paper an extension of a previously developed and well-proven technique for the estimate of the INL of an ADC via spectral analysis methods is presented and discussed. Until now the authors applied this technique only to estimate the static INL, but further in-depth analyses show that it can be used to measure the ADC response to a sine wave even if the dynamic nonlinearity cannot be neglected (i.e. when the frequency of the input signal is higher than a given limit). To prove the validity of the method the authors compare their results with those obtained by the time-consuming but certainly accurate method, i.e. direct comparison of the average of many output records with the input sine wave.

Measuring dynamic nonlinearity of A/D converters via spectral methods / Adamo, F.; Attivissimo, F.; Giaquinto, N; Kale, I.. - ELETTRONICO. - (2003). (Intervento presentato al convegno 8th International Workshop on ADC Modelling and Testing, IWADC 2003 tenutosi a Perugia, Italy nel September 8-10, 2003).

Measuring dynamic nonlinearity of A/D converters via spectral methods

Adamo F.;Attivissimo F.;Giaquinto N;
2003-01-01

Abstract

In this paper an extension of a previously developed and well-proven technique for the estimate of the INL of an ADC via spectral analysis methods is presented and discussed. Until now the authors applied this technique only to estimate the static INL, but further in-depth analyses show that it can be used to measure the ADC response to a sine wave even if the dynamic nonlinearity cannot be neglected (i.e. when the frequency of the input signal is higher than a given limit). To prove the validity of the method the authors compare their results with those obtained by the time-consuming but certainly accurate method, i.e. direct comparison of the average of many output records with the input sine wave.
2003
8th International Workshop on ADC Modelling and Testing, IWADC 2003
Measuring dynamic nonlinearity of A/D converters via spectral methods / Adamo, F.; Attivissimo, F.; Giaquinto, N; Kale, I.. - ELETTRONICO. - (2003). (Intervento presentato al convegno 8th International Workshop on ADC Modelling and Testing, IWADC 2003 tenutosi a Perugia, Italy nel September 8-10, 2003).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/17325
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