Microwave reflectometry is a powerful measurement technique that can be effectively employed for a number of practical applications (e.g., for monitoring purposes, impedance variation evaluation, cable faults detection). This chapter addresses reflectometric measurements carried out in the time domain (TD). After a brief introduction to the theoretical aspects, several reflectometry-based laboratory experiments are presented concerning the identification and evaluation of unknown electric loads, the estimation of the wave propagation along cables, and the dielectric characterization of materials. As discussed later, some experiments are proposed twice, using two different types of equipment: (1) an oscilloscope and a function generator and (2) a dedicated instrument (i.e., a reflectometer).

Reflectometric Measurements / Cataldo, A.; Giaquinto, N.; De Benedetto, E.; Masciullo, A.; Cannazza, G.; Lorenzo, I.; Nicolazzo, J.; Meo, M. T.; De Monte, A.; Parisi, G.; Gaetani, F.. - STAMPA. - 663:(2020), pp. 145-179. [10.1007/978-3-030-46740-1_4]

Reflectometric Measurements

Giaquinto N.;
2020-01-01

Abstract

Microwave reflectometry is a powerful measurement technique that can be effectively employed for a number of practical applications (e.g., for monitoring purposes, impedance variation evaluation, cable faults detection). This chapter addresses reflectometric measurements carried out in the time domain (TD). After a brief introduction to the theoretical aspects, several reflectometry-based laboratory experiments are presented concerning the identification and evaluation of unknown electric loads, the estimation of the wave propagation along cables, and the dielectric characterization of materials. As discussed later, some experiments are proposed twice, using two different types of equipment: (1) an oscilloscope and a function generator and (2) a dedicated instrument (i.e., a reflectometer).
2020
Basic Theory and Laboratory Experiments in Measurement and Instrumentation: A Practice-Oriented Guide
978-3-030-46739-5
978-3-030-46740-1
Springer
Reflectometric Measurements / Cataldo, A.; Giaquinto, N.; De Benedetto, E.; Masciullo, A.; Cannazza, G.; Lorenzo, I.; Nicolazzo, J.; Meo, M. T.; De Monte, A.; Parisi, G.; Gaetani, F.. - STAMPA. - 663:(2020), pp. 145-179. [10.1007/978-3-030-46740-1_4]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/205304
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