A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (Bi 2 Te 2.2 Se 0.8 ). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.
Phase-resolved terahertz near-field nanoscopy of a topological insulator phonon-polariton mode / Giordano, M. C.; Viti, L.; Columbo, L.; Brambilla, M.; Scamarcio, G.; Vitiello, M. S.. - ELETTRONICO. - (2018), pp. 1-2. (Intervento presentato al convegno 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) tenutosi a Nagoja (Japan)) [10.1109/IRMMW-THz.2018.8510167].
Phase-resolved terahertz near-field nanoscopy of a topological insulator phonon-polariton mode
Columbo, L.;Brambilla, M.;
2018-01-01
Abstract
A novel scattering-type near-field optical microscopy (s-SNOM) system based on a terahertz (THz) quantum cascade laser operating in self-detection mode is employed to probe a resonant phonon-polariton mode of a thin topological insulator flake (Bi 2 Te 2.2 Se 0.8 ). Background-free near-field imaging with nanoscale spatial resolution is demonstrated.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
