We report on the statistical assessment of the properties of directional couplers based on silicon waveguides, growth by IMEC fab in Belgium in the framework of the Europractice partnership. We characterized 25 chips from a multi-project wafer, each one containing several passive add-drop ring resonators with different coupling strengths. The analysis was repeated for chip temperatures ranging from 25°C to 55°C. The measurements we performed confirmed the reliability of the iSiPP50G platform used to growth the considered components.
Statistical assessment of silicon photonics components in multi-project wafers / Giannuzzi, Giuseppe; Bardella, Paolo. - ELETTRONICO. - 11691:1169111(2021). (Intervento presentato al convegno SPIE OPTO, 2021 nel 6-12 MARCH 2021) [10.1117/12.2578931].
Statistical assessment of silicon photonics components in multi-project wafers
GIUSEPPE, GIANNUZZI
;
2021-01-01
Abstract
We report on the statistical assessment of the properties of directional couplers based on silicon waveguides, growth by IMEC fab in Belgium in the framework of the Europractice partnership. We characterized 25 chips from a multi-project wafer, each one containing several passive add-drop ring resonators with different coupling strengths. The analysis was repeated for chip temperatures ranging from 25°C to 55°C. The measurements we performed confirmed the reliability of the iSiPP50G platform used to growth the considered components.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
