Strain and thermal characterization of the cladding layer in InGaAs ridge waveguide (RWG) lasers is reported. We tune up a photoluminescence micro-probe technique for determining the temperature and strain profile of the cladding layer, in steps of ∼1μm, with a temperature resolution <1°K. A correlation between the facet temperature and type of protective coating is found. A correlation has been obtained between the facet temperature and the laser oscillating mode. The experimental strain profile is well reproduced by an inclined line-force model.

InGaAs Quantum-Well-Laser Strain and Temperature profile investigated by Microprobe Optical Spectroscopy / Lugara, M.; Corvasce, C.; Spagnolo, V.; Scamarcio, G.; Ferrara, M.; Catalano, I. M.; Pellegrmo, S.; Del Giudice, M.; Re, M. G.. - STAMPA. - 2778:(1996), pp. 725-726. (Intervento presentato al convegno 17th Congress of the International Commission for Optics: Optics for Science and New Technology tenutosi a Taejon, South Korea nel August 19-23, 1996) [10.1117/12.2316043].

InGaAs Quantum-Well-Laser Strain and Temperature profile investigated by Microprobe Optical Spectroscopy

Spagnolo, V.;
1996-01-01

Abstract

Strain and thermal characterization of the cladding layer in InGaAs ridge waveguide (RWG) lasers is reported. We tune up a photoluminescence micro-probe technique for determining the temperature and strain profile of the cladding layer, in steps of ∼1μm, with a temperature resolution <1°K. A correlation between the facet temperature and type of protective coating is found. A correlation has been obtained between the facet temperature and the laser oscillating mode. The experimental strain profile is well reproduced by an inclined line-force model.
1996
17th Congress of the International Commission for Optics: Optics for Science and New Technology
0-8194-2164-2
InGaAs Quantum-Well-Laser Strain and Temperature profile investigated by Microprobe Optical Spectroscopy / Lugara, M.; Corvasce, C.; Spagnolo, V.; Scamarcio, G.; Ferrara, M.; Catalano, I. M.; Pellegrmo, S.; Del Giudice, M.; Re, M. G.. - STAMPA. - 2778:(1996), pp. 725-726. (Intervento presentato al convegno 17th Congress of the International Commission for Optics: Optics for Science and New Technology tenutosi a Taejon, South Korea nel August 19-23, 1996) [10.1117/12.2316043].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/23490
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