In the paper a new frequency-domain approach to measure and correct the static nonlinearity error of A/D converters is analyzed. The nonlinearity is (i) measured as a linear combination of Chebyshev polynomial, whose coefficients are derived via frequency-domain analysis, and (ii) corrected with a nonlinear equation solving method, which makes use of the parametric form of the static characteristic. The proposed methodology is especially suited for dithered converters, due to their particular features of smoother nonlinearity and very high resolution. Both simulation and experimental results are reported, quantifying also the achieved increase of effective bits.

A/D Converters Nonlinearity Measurement and Correction by Frequency Analysis and Dither / Adamo, Francesco; Attivissimo, Filippo; Giaquinto, Nicola; Trotta, Amerigo. - (2002), pp. 201-206. (Intervento presentato al convegno 19th IEEE Instrumentation and Measurement Technology Conference, IMTC/2002 tenutosi a Anchorage, AK nel May 21-23, 2002) [10.1109/IMTC.2002.1006840].

A/D Converters Nonlinearity Measurement and Correction by Frequency Analysis and Dither

ADAMO, Francesco;ATTIVISSIMO, Filippo;GIAQUINTO, Nicola;TROTTA, Amerigo
2002-01-01

Abstract

In the paper a new frequency-domain approach to measure and correct the static nonlinearity error of A/D converters is analyzed. The nonlinearity is (i) measured as a linear combination of Chebyshev polynomial, whose coefficients are derived via frequency-domain analysis, and (ii) corrected with a nonlinear equation solving method, which makes use of the parametric form of the static characteristic. The proposed methodology is especially suited for dithered converters, due to their particular features of smoother nonlinearity and very high resolution. Both simulation and experimental results are reported, quantifying also the achieved increase of effective bits.
2002
19th IEEE Instrumentation and Measurement Technology Conference, IMTC/2002
0-7803-7218-2
A/D Converters Nonlinearity Measurement and Correction by Frequency Analysis and Dither / Adamo, Francesco; Attivissimo, Filippo; Giaquinto, Nicola; Trotta, Amerigo. - (2002), pp. 201-206. (Intervento presentato al convegno 19th IEEE Instrumentation and Measurement Technology Conference, IMTC/2002 tenutosi a Anchorage, AK nel May 21-23, 2002) [10.1109/IMTC.2002.1006840].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/23500
Citazioni
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 0
social impact