We have developed a full simulation code to evaluate the response of silicon strip detectors (SSDs) to ionizing.particles. This simulation can be applied in the design stage of a SSD, when the detector parameters have to be chosen in order to optimize its performance. Our code allows to evaluate the electrical signals produced by ionizing particles crossing a SSD. All the physical processes leading to the generation of electron-hole pairs in silicon have been taken into account. Induced current signals on the readout strips are evaluated using the Shockley-Ramo theorem to the charge carriers propagating inside the detector volume. A simulation of the readout electronics has been implemented, to convert current signals into voltage signals. The predictions of our Monte Carlo simulation have been compared with experimental data taken using a 400 mum thick silicon strip detector with a 228 mum strip pitch exposed to a pion beam. (C) 2004 Elsevier B.V. All rights reserved.
A new Monte Carlo code for full simulation of silicon strip detectors / Brigida, M; Favuzzi, C; Fusco, P; Gargano, F; Giglietto, N; Giordano, F; Loparco, F; Marangelli, B; Mazziotta, Mn; Mirizzi, N; Raino, S; Spinelli, P. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 533:3(2004), pp. 322-343. [10.1016/j.nima.2004.05.127]
A new Monte Carlo code for full simulation of silicon strip detectors
Favuzzi C;Giglietto N;
2004-01-01
Abstract
We have developed a full simulation code to evaluate the response of silicon strip detectors (SSDs) to ionizing.particles. This simulation can be applied in the design stage of a SSD, when the detector parameters have to be chosen in order to optimize its performance. Our code allows to evaluate the electrical signals produced by ionizing particles crossing a SSD. All the physical processes leading to the generation of electron-hole pairs in silicon have been taken into account. Induced current signals on the readout strips are evaluated using the Shockley-Ramo theorem to the charge carriers propagating inside the detector volume. A simulation of the readout electronics has been implemented, to convert current signals into voltage signals. The predictions of our Monte Carlo simulation have been compared with experimental data taken using a 400 mum thick silicon strip detector with a 228 mum strip pitch exposed to a pion beam. (C) 2004 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.