In this paper we review in depth a procedure to compare the performance of CNTFET and MOSFET devices operating in sub-threshold region for ultra-low power applications. This aim is obtained through the design of a SRAM cell. The first design is based on our CNTFET model, while for the second one we use the BSIM4 model of the ADS library. At last the comparison between the two considered technologies are quantitatively presented, showing and discussing the improvements obtained with CNTFET technology. All simulations are carried out using the software Advanced Design System (ADS), which is compatible with the Verilog-A programming language, avoiding so the problems presented in SPICE used in previous designs proposed in literature.

A Procedure to Compare CNTFET and CMOS Technologies through the Design of a SRAM Cell: A Review / Marani, Roberto; Perri, Anna Gina. - In: INTERNATIONAL JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY. - ISSN 2423-5911. - ELETTRONICO. - 20:2(2024), pp. 113-127. [10.22034/ijnn.2024.2021428.2472]

A Procedure to Compare CNTFET and CMOS Technologies through the Design of a SRAM Cell: A Review

Roberto Marani
Software
;
Anna Gina Perri
Conceptualization
2024-01-01

Abstract

In this paper we review in depth a procedure to compare the performance of CNTFET and MOSFET devices operating in sub-threshold region for ultra-low power applications. This aim is obtained through the design of a SRAM cell. The first design is based on our CNTFET model, while for the second one we use the BSIM4 model of the ADS library. At last the comparison between the two considered technologies are quantitatively presented, showing and discussing the improvements obtained with CNTFET technology. All simulations are carried out using the software Advanced Design System (ADS), which is compatible with the Verilog-A programming language, avoiding so the problems presented in SPICE used in previous designs proposed in literature.
2024
A Procedure to Compare CNTFET and CMOS Technologies through the Design of a SRAM Cell: A Review / Marani, Roberto; Perri, Anna Gina. - In: INTERNATIONAL JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY. - ISSN 2423-5911. - ELETTRONICO. - 20:2(2024), pp. 113-127. [10.22034/ijnn.2024.2021428.2472]
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/274260
Citazioni
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact