Impact of magnetic field on the stability of the CMS GE1/1 GEM detector operation

Abbas, M.; Abbott, S.; Abbrescia, M.; Abdalla, H.; Abdelalim, A.; Abuzeid, S.; Aebi, D.; Agapitos, A.; Ahmad, A.; Ahmed, A.; Ahmed, W.; Aimè, C.; Akhter, T.; Alsufyani, B.; Aruta, C.; Asghar, I.; Aspell, P.; Avila, C.; Babbar, J.; Ban, Y.; Band, R.; Bansal, S.; Benussi, L.; Bhatnagar, V.; Bianco, M.; Bianco, S.; Black, K.; Borgonovi, L.; Bouhali, O.; Braghieri, A.; Braibant, S.; Butalla, S.; Cagnotta, A.; Calzaferri, S.; Campagnola, R.; Caponero, M.; Carlson, J.; Cassese, F.; Cavallo, N.; Chauhan, S. S.; Choudhary, B.; Colafranceschi, S.; Colaleo, A.; Conde Garcia, A.; Datta, A.; De Iorio, A.; De Lentdecker, G.; Dell Olio, D.; De Robertis, G.; Dharmaratna, W.; Elkafrawy, T.; Erbacher, R.; Everaerts, P.; Fabozzi, F.; Fallavollita, F.; Fiorina, D.; Franco, M.; Galloni, C.; Giacomelli, P.; Gigli, S.; Gilmore, J.; Gola, M.; Gutierrez, A.; Hadjiiska, R.; Hoepfner, K.; Hohlmann, M.; Hong, Y.; Hoorani, H.; Huang, T.; Iaydjiev, P.; Irshad, A.; Iorio, A.; Ivone, F.; Jang, W.; Jaramillo, J.; Jeong, Y.; Juska, E.; Kailasapathy, B.; Kamon, T.; Kang, Y.; Karchin, P.; Kaur, A.; Kaur, H.; Keller, H.; Kim, H.; Kim, J.; Kim, M.; Kim, S.; Ko, B.; Kumar, A.; Kumar, S.; Lacalamita, N.; Lee, J. S. H.; Levin, A.; Li, Q.; Licciulli, F.; Lista, L.; Liyanage, K.; Loddo, F.; Luhach, M.; Maggi, M.; Maghrbi, Y.; Majumdar, N.; Malagalage, K.; Martiradonna, S.; Merlin, J.; Misheva, M.; Mocellin, G.; Moureaux, L.; Muhammad, A.; Muhammad, S.; Mukhopadhyay, S.; Naimuddin, M.; Nuzzo, S.; Oliveira, R.; Paolucci, P.; Park, I. C.; Passamonti, L.; Passeggio, G.; Peck, A.; Pellecchia, A.; Perera, N.; Petre, L.; Piccolo, D.; Pierluigi, D.; Radogna, R.; Raffone, G.; Ramirez, F.; Ranieri, A.; Rashevski, G.; Rathjens, D.; Regnery, B.; Rendon, C.; Riccardi, C.; Rossi, B.; Rout, P.; Ruiz, J. D.; Russo, A.; Safonov, A.; Sahota, A. K.; Saltzberg, D.; Saviano, G.; Shah, A.; Sharma, A.; Sharma, R.; Sheokand, T.; Shopova, M.; Simone, F.; Singh, J.; Sonnadara, U.; Sturdy, J.; Sultanov, G.; Szillasi, Z.; Teague, D.; Teyssier, D.; Tytgat, M.; Vai, I.; Vanegas, N.; Venditti, R.; Verwilligen, P.; Vetens, W.; Virdi, A. K.; Vitulo, P.; Wajid, A.; Wang, D.; Wang, K.; Watson, I. J.; Wickramage, N.; Wickramarathna, D. D. C.; Yanes, E.; Yang, S.; Yang, U.; Yang, Y.; Yoon, I.; You, Z.; Yu, I.; Zaleski, S.

doi:10.1088/1748-0221/18/11/p11029

The Gas Electron Multiplier (GEM) detectors of the GE1/1 station of the CMS experiment have been operated in the CMS magnetic field for the first time on the 7(th) of October 2021. During the magnetic field ramps, several discharge phenomena were observed, leading to instability in the GEM High Voltage (HV) power system. In order to reproduce the behavior, it was decided to conduct a dedicated test at the CERN North Area with the Goliath magnet, using four GE1/1 spare chambers. The test consisted in studying the characteristics of discharge events that occurred in different detector configurations and external conditions. Multiple magnetic field ramps were performed in sequence: patterns in the evolution of the discharge rates were observed with these data. The goal of this test is the understanding of the experimental conditions inducing discharges and short circuits in a GEM foil.The results of this test lead to the development of procedure for the optimal operation and performance of GEM detectors in the CMS experiment during the magnet ramps. Another important result is the estimation of the probability of short circuit generation, at 68 % confidence level, p(short)(HV OFF) = 0.42(-0.35)(+0.94)% with detector HV OFF and p(short)(HV OFF) < 0.49% with the HV ON. These numbers are specific for the detectors used during this test, but they provide a first quantitative indication on the phenomenon, and a point of comparison for future studies adopting the same procedure.

Impact of magnetic field on the stability of the CMS GE1/1 GEM detector operation / Abbas, M.; Abbott, S.; Abbrescia, M.; Abdalla, H.; Abdelalim, A.; Abuzeid, S.; Aebi, D.; Agapitos, A.; Ahmad, A.; Ahmed, A.; Ahmed, W.; Aimè, C.; Akhter, T.; Alsufyani, B.; Aruta, C.; Asghar, I.; Aspell, P.; Avila, C.; Babbar, J.; Ban, Y.; Band, R.; Bansal, S.; Benussi, L.; Bhatnagar, V.; Bianco, M.; Bianco, S.; Black, K.; Borgonovi, L.; Bouhali, O.; Braghieri, A.; Braibant, S.; Butalla, S.; Cagnotta, A.; Calzaferri, S.; Campagnola, R.; Caponero, M.; Carlson, J.; Cassese, F.; Cavallo, N.; Chauhan, S. S.; Choudhary, B.; Colafranceschi, S.; Colaleo, A.; Conde Garcia, A.; Datta, A.; De Iorio, A.; De Lentdecker, G.; Dell Olio, D.; De Robertis, G.; Dharmaratna, W.; Elkafrawy, T.; Erbacher, R.; Everaerts, P.; Fabozzi, F.; Fallavollita, F.; Fiorina, D.; Franco, M.; Galloni, C.; Giacomelli, P.; Gigli, S.; Gilmore, J.; Gola, M.; Gutierrez, A.; Hadjiiska, R.; Hoepfner, K.; Hohlmann, M.; Hong, Y.; Hoorani, H.; Huang, T.; Iaydjiev, P.; Irshad, A.; Iorio, A.; Ivone, F.; Jang, W.; Jaramillo, J.; Jeong, Y.; Juska, E.; Kailasapathy, B.; Kamon, T.; Kang, Y.; Karchin, P.; Kaur, A.; Kaur, H.; Keller, H.; Kim, H.; Kim, J.; Kim, M.; Kim, S.; Ko, B.; Kumar, A.; Kumar, S.; Lacalamita, N.; Lee, J. S. H.; Levin, A.; Li, Q.; Licciulli, F.; Lista, L.; Liyanage, K.; Loddo, F.; Luhach, M.; Maggi, M.; Maghrbi, Y.; Majumdar, N.; Malagalage, K.; Martiradonna, S.; Merlin, J.; Misheva, M.; Mocellin, G.; Moureaux, L.; Muhammad, A.; Muhammad, S.; Mukhopadhyay, S.; Naimuddin, M.; Nuzzo, S.; Oliveira, R.; Paolucci, P.; Park, I. C.; Passamonti, L.; Passeggio, G.; Peck, A.; Pellecchia, A.; Perera, N.; Petre, L.; Piccolo, D.; Pierluigi, D.; Radogna, R.; Raffone, G.; Ramirez, F.; Ranieri, A.; Rashevski, G.; Rathjens, D.; Regnery, B.; Rendon, C.; Riccardi, C.; Rossi, B.; Rout, P.; Ruiz, J. D.; Russo, A.; Safonov, A.; Sahota, A. K.; Saltzberg, D.; Saviano, G.; Shah, A.; Sharma, A.; Sharma, R.; Sheokand, T.; Shopova, M.; Simone, F.; Singh, J.; Sonnadara, U.; Sturdy, J.; Sultanov, G.; Szillasi, Z.; Teague, D.; Teyssier, D.; Tytgat, M.; Vai, I.; Vanegas, N.; Venditti, R.; Verwilligen, P.; Vetens, W.; Virdi, A. K.; Vitulo, P.; Wajid, A.; Wang, D.; Wang, K.; Watson, I. J.; Wickramage, N.; Wickramarathna, D. D. C.; Yanes, E.; Yang, S.; Yang, U.; Yang, Y.; Yoon, I.; You, Z.; Yu, I.; Zaleski, S.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 18:11(2023). [10.1088/1748-0221/18/11/p11029]