We searched for bound neutron decay via n → nu_bar + K0 predicted by the grand unified theories in 0.401 Mton · years exposure of all pure water phases in the Super-Kamiokande detector. About 4.4 times more data than in the previous search have been analyzed by a new method including a spectrum fit to kaon invariant mass distributions. No significant data excess has been observed in the signal regions. As a result of this analysis, we set a lower limit of 7.8 × 10^32 years on the neutron lifetime at a 90% confidence level.

Search for neutron decay into an antineutrino and a neutral kaon in 0.401 megaton-years exposure of Super-Kamiokande / Yamauchi, K., Abe, K., Abe, S., Asaoka, Y., Harada, M., Hayato, Y., Hiraide, K., Hosokawa, K., Ieki, K., Ikeda, M., Kameda, J., Kanemura, Y., Kataoka, Y., Miki, S., Mine, S., Miura, M., Moriyama, S., Nakahata, M., Nakayama, S., Noguchi, Y., et al.. - In: PHYSICAL REVIEW D. - ISSN 2470-0010. - ELETTRONICO. - 112:9(2025). [10.1103/thqt-8fp1]

Search for neutron decay into an antineutrino and a neutral kaon in 0.401 megaton-years exposure of Super-Kamiokande

Berardi, V.
Membro del Collaboration Group
;
Calabria, N.  F.;
2025

Abstract

We searched for bound neutron decay via n → nu_bar + K0 predicted by the grand unified theories in 0.401 Mton · years exposure of all pure water phases in the Super-Kamiokande detector. About 4.4 times more data than in the previous search have been analyzed by a new method including a spectrum fit to kaon invariant mass distributions. No significant data excess has been observed in the signal regions. As a result of this analysis, we set a lower limit of 7.8 × 10^32 years on the neutron lifetime at a 90% confidence level.
2025
Search for neutron decay into an antineutrino and a neutral kaon in 0.401 megaton-years exposure of Super-Kamiokande / Yamauchi, K., Abe, K., Abe, S., Asaoka, Y., Harada, M., Hayato, Y., Hiraide, K., Hosokawa, K., Ieki, K., Ikeda, M., Kameda, J., Kanemura, Y., Kataoka, Y., Miki, S., Mine, S., Miura, M., Moriyama, S., Nakahata, M., Nakayama, S., Noguchi, Y., et al.. - In: PHYSICAL REVIEW D. - ISSN 2470-0010. - ELETTRONICO. - 112:9(2025). [10.1103/thqt-8fp1]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/294862
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