Compressed sensing (CS) with single-pixel detectors and optical phased arrays (OPAs) allows efficient image reconstruction by exploiting structured speckle patterns. This study investigates how spatial misalignments affect reconstruction fidelity. We numerically simulate the alignment errors of different magnitude and evaluate the reconstructed image using both the structural similarity index (SSIM) and the peak signal-tonoise ratio (PSNR). These findings highlight the sensitivity of compressed sensing to spatial misalignments, emphasizing the need for precise control in experimental setups to ensure reliable image reconstruction.

Inaccuracy Amplified: Compressed Sensing Under Experimental Misalignment / Ersöz, Başak; Chaudhary, Priyanka; Bardella, Paolo; Dabbicco, Maurizio; Columbo, Lorenzo; Brambilla, Massimo. - ELETTRONICO. - (2025), pp. 51-52. ( 2025 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2025 Lodz University of Technology, pol 2025) [10.1109/nusod64393.2025.11199519].

Inaccuracy Amplified: Compressed Sensing Under Experimental Misalignment

Brambilla, Massimo
2025

Abstract

Compressed sensing (CS) with single-pixel detectors and optical phased arrays (OPAs) allows efficient image reconstruction by exploiting structured speckle patterns. This study investigates how spatial misalignments affect reconstruction fidelity. We numerically simulate the alignment errors of different magnitude and evaluate the reconstructed image using both the structural similarity index (SSIM) and the peak signal-tonoise ratio (PSNR). These findings highlight the sensitivity of compressed sensing to spatial misalignments, emphasizing the need for precise control in experimental setups to ensure reliable image reconstruction.
2025
2025 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2025
https://ieeexplore.ieee.org/abstract/document/11199519
Inaccuracy Amplified: Compressed Sensing Under Experimental Misalignment / Ersöz, Başak; Chaudhary, Priyanka; Bardella, Paolo; Dabbicco, Maurizio; Columbo, Lorenzo; Brambilla, Massimo. - ELETTRONICO. - (2025), pp. 51-52. ( 2025 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2025 Lodz University of Technology, pol 2025) [10.1109/nusod64393.2025.11199519].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/296800
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