We present a strategy to extend single-pixel imaging (SPI) into the infrared by replacing conventional spatial light modulators (SLMs) with broadband-compatible random diffractive elements. SPI reconstructs images from total scattered intensity correlated with structured illumination patterns, typically generated by SLMs such as liquid crystal devices or Digital Micromirror Devices (DMDs). However, their limited performance in the infrared and terahertz hinders broader applicability. Our approach employs a nanocomposite film made by embedding electro spun nanofibers in a UV-curable resin on glass, using a patented process by Linari Engineering. Speckle patterns are recorded at 650 nm and 830 nm under various conditions. Plane wave illumination yields optimal pattern orthogonality. We discuss the influence of structural parameters and illumination wavelength, and the potential integration of these random modulators in compressive sensing-based SPI frameworks.
Characterization of Nanofiber Bundles for Single Pixel Imaging / Chaudhary, Priyanka; Bardella, Paolo; Brambilla, Massimo; Loverre, Pasquale; Columbo, Lorenzo; Linari, Stefano; Ersoz, Basak; Dabbicco, Maurizio. - (2025), pp. 071-074. ( 15th IEEE International Conference "Nanomaterials: Applications and Properties", NAP 2025 Slovenia 2025) [10.1109/nap68437.2025.11216273].
Characterization of Nanofiber Bundles for Single Pixel Imaging
Brambilla, Massimo;
2025
Abstract
We present a strategy to extend single-pixel imaging (SPI) into the infrared by replacing conventional spatial light modulators (SLMs) with broadband-compatible random diffractive elements. SPI reconstructs images from total scattered intensity correlated with structured illumination patterns, typically generated by SLMs such as liquid crystal devices or Digital Micromirror Devices (DMDs). However, their limited performance in the infrared and terahertz hinders broader applicability. Our approach employs a nanocomposite film made by embedding electro spun nanofibers in a UV-curable resin on glass, using a patented process by Linari Engineering. Speckle patterns are recorded at 650 nm and 830 nm under various conditions. Plane wave illumination yields optimal pattern orthogonality. We discuss the influence of structural parameters and illumination wavelength, and the potential integration of these random modulators in compressive sensing-based SPI frameworks.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

