To monitor the density of photo-generated charge carriers on a semiconductor surface, we demonstrate a detectorless imaging system based on the analysis of the optical feedback in terahertz quantum cascade lasers. Photo-excited free electron carriers are created in high resistivity n-type silicon wafers via low power (congruent to 40 mW/cm(2)) continuous wave pump laser in the near infrared spectral range. A spatial light modulator allows to directly reconfigure and control the photo-patterned intensity and the associated free-carrier density distribution. The experimental results are in good agreement with the numerical simulations.
|Titolo:||Imaging of free carriers in semiconductors via optical feedback in terahertz quantum cascade lasers|
|Data di pubblicazione:||2014|
|Digital Object Identifier (DOI):||10.1063/1.4863671|
|Appare nelle tipologie:||1.1 Articolo in rivista|