For the construction of the silicon microstrip detectors for the Tracker of the CMS experiment, two different substrate choices were investigated. A high-resistivity (6 k Omega cm) substrate with (111) crystal orientation and a low-resistivity (2 k Omega cm) one with (100) crystal orientation. The interstrip and backplane capacitances mere measured before and after the exposure to radiation in a range of strip pitches from 60 mu m to 240 mu m and for values of the width-over-pitch ratio between 0.1 and 0.5.
|Titolo:||Comparative study of < 111 > and < 100 > crystals and capacitance measurements on Si strip detectors in CMS|
|Data di pubblicazione:||1999|
|Appare nelle tipologie:||1.1 Articolo in rivista|