The facet temperature profile and the thermal resistance of operating quantum-cascade lasers (QCLs) have been assessed using a microprobe band-to-band photoluminescence technique. Substrate-side and epilayer-side-mounted QCLs based on GaInAs/AlInAs/InP and GaAs/AlGaAs material systems have been compared. The dependence of the thermal resistance on the CW or pulsed injection conditions and its correlation with the output power have been studied. These results were used as inputs for a two-dimensional heat-diffusion model which gives the heat fluxes and the thermal conductivity of the active regions, in order to design QCLs with improved thermal properties.

Thermal characteristics of quantum-cascade lasers by micro-probe optical spectroscopy / Spagnolo, V.; Scamarcio, G.; Marano, D.; Troccoli, M.; Capasso, F.; Gmachl, C.; Sergent, A. M.; Hutchinson, A. L.; Sivco, D. L.; Cho, A. Y.; Page, H.; Becker, C.; Sirtori, C.. - In: IEE PROCEEDINGS. OPTOELECTRONICS. - ISSN 1350-2433. - STAMPA. - 150:4(2003), pp. 298-305. [10.1049/ip-opt:20030610]

Thermal characteristics of quantum-cascade lasers by micro-probe optical spectroscopy

Spagnolo, V.;
2003-01-01

Abstract

The facet temperature profile and the thermal resistance of operating quantum-cascade lasers (QCLs) have been assessed using a microprobe band-to-band photoluminescence technique. Substrate-side and epilayer-side-mounted QCLs based on GaInAs/AlInAs/InP and GaAs/AlGaAs material systems have been compared. The dependence of the thermal resistance on the CW or pulsed injection conditions and its correlation with the output power have been studied. These results were used as inputs for a two-dimensional heat-diffusion model which gives the heat fluxes and the thermal conductivity of the active regions, in order to design QCLs with improved thermal properties.
2003
Thermal characteristics of quantum-cascade lasers by micro-probe optical spectroscopy / Spagnolo, V.; Scamarcio, G.; Marano, D.; Troccoli, M.; Capasso, F.; Gmachl, C.; Sergent, A. M.; Hutchinson, A. L.; Sivco, D. L.; Cho, A. Y.; Page, H.; Becker, C.; Sirtori, C.. - In: IEE PROCEEDINGS. OPTOELECTRONICS. - ISSN 1350-2433. - STAMPA. - 150:4(2003), pp. 298-305. [10.1049/ip-opt:20030610]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/502
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