Applications are presented of the general shadow-projection moiré model described in the companion paper, "A general model for moiré contouring, part 1: theory." Two examples are discussed in detail. One example deals with the deflection of a large-size thin panel subjected to bending. The other example analyzes the accuracy that can be achieved in laser lithography rapid prototyping. The first example illustrates some theoretical aspects of the general contouring model proposed in this research and explains the reasons for differences between theoretical predictions and experimental results. In the second example, the whole process of data gathering and merging using geometric primitives and optimization techniques is demonstrated practically. Finally, a clear relationship between the measured standard deviations and moiré sensitivity values is obtained. The results show that the proposed methodologies lead to a quasi-quadratic correlation

A general model for moiré contouring. Part II: Applications / Sciammarella, C. A.; Lamberti, Luciano; Boccaccio, Antonio; Cosola, E.; Posa, D.. - In: OPTICAL ENGINEERING. - ISSN 0091-3286. - 47:3(2008). [10.1117/1.2899040]

A general model for moiré contouring. Part II: Applications

LAMBERTI, Luciano;BOCCACCIO, Antonio;
2008-01-01

Abstract

Applications are presented of the general shadow-projection moiré model described in the companion paper, "A general model for moiré contouring, part 1: theory." Two examples are discussed in detail. One example deals with the deflection of a large-size thin panel subjected to bending. The other example analyzes the accuracy that can be achieved in laser lithography rapid prototyping. The first example illustrates some theoretical aspects of the general contouring model proposed in this research and explains the reasons for differences between theoretical predictions and experimental results. In the second example, the whole process of data gathering and merging using geometric primitives and optimization techniques is demonstrated practically. Finally, a clear relationship between the measured standard deviations and moiré sensitivity values is obtained. The results show that the proposed methodologies lead to a quasi-quadratic correlation
2008
A general model for moiré contouring. Part II: Applications / Sciammarella, C. A.; Lamberti, Luciano; Boccaccio, Antonio; Cosola, E.; Posa, D.. - In: OPTICAL ENGINEERING. - ISSN 0091-3286. - 47:3(2008). [10.1117/1.2899040]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/6526
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