Thickness non-uniformities in electrostatic capacitors and in electroactive polymers arising from manufacturing processes or electromechanical induced inhomogeneous deformations may lead todrastic charge and electric ﬁeld localizations and, ultimately, to an anticipated device failure. Based on ageometric interpretation of the Gauss equation enlightening the effect of the electrode curvature, weobtain an analytic expression of the electric ﬁeld and of the surface charge density localization for nonperfectly planar capacitors with symmetric thickness non-uniformities. The efﬁciency of the model isexploited by analyzing speciﬁc boundary value problems of technological interest.
|Autori interni:||PUGLISI, Giuseppe|
|Titolo:||Electric field localizations in thin dielectric films with thickness non-uniformities|
|Rivista:||JOURNAL OF ELECTROSTATICS|
|Data di pubblicazione:||2012|
|Digital Object Identifier (DOI):||10.1016/j.elstat.2012.03.012|
|Appare nelle tipologie:||1.1 Articolo in rivista|