Based on an energy minimization approach, we analyse the elastic deformations of a thin electroactive polymer (EAP) film sandwiched by two elastic electrodes with non-negligible stiffness. We analytically show the existence of a critical value of the electrode voltage for which non-homogeneous solutions bifurcate from the homogeneous equilibrium state, leading to the pull-in phenomenon. This threshold strongly decreases the limit value proposed in the literature considering only homogeneous deformations. We explicitly discuss the influence of geometric and material parameters together with boundary conditions in the attainment of the different failure modes observed in EAP devices. In particular, we obtain the optimum values of these parameters leading to the maximum activation performances of the device
Failure modes in electroactive polymer thin films with elastic electrodes / DE TOMMASI, Domenico; Puglisi, Giuseppe; Zurlo, G.. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 47:6(2014). [10.1088/0022-3727/47/6/065502]
Failure modes in electroactive polymer thin films with elastic electrodes
DE TOMMASI, Domenico;PUGLISI, Giuseppe;
2014-01-01
Abstract
Based on an energy minimization approach, we analyse the elastic deformations of a thin electroactive polymer (EAP) film sandwiched by two elastic electrodes with non-negligible stiffness. We analytically show the existence of a critical value of the electrode voltage for which non-homogeneous solutions bifurcate from the homogeneous equilibrium state, leading to the pull-in phenomenon. This threshold strongly decreases the limit value proposed in the literature considering only homogeneous deformations. We explicitly discuss the influence of geometric and material parameters together with boundary conditions in the attainment of the different failure modes observed in EAP devices. In particular, we obtain the optimum values of these parameters leading to the maximum activation performances of the deviceI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.