In this work we report on our recent studies on Silicon-Nitride PhC single-defect nanocavity membranes embedding colloidal nanocrystals. A novel structure consisting of a layer of nanocrystals sandwiched between two layers of Silicon-Nitride has been used. Photoluminescence measurements prove the efficient coupling among the nanoemitters and the optical modes localized in the Si3N4 photonic crystal nanocavities, showing enhancement of the spontaneous emission in resonant conditions. This technology enables the realization of NC-based ultra-small lasers and non-classical light sources operating at visible wavelengths on silicon substrates. © 2009 Elsevier B.V. All rights reserved.

Emission control of colloidal nanocrystals embedded in Si3N4 photonic crystal H1 nanocavities / Qualtieri, A.; Pisanello, F.; Grande, M.; Stomeo, T.; Martiradonna, L.; Epifani, G.; Fiore, A.; Passaseo, A.; De Vittorio, M.. - In: MICROELECTRONIC ENGINEERING. - ISSN 0167-9317. - STAMPA. - 87:5-8(2010), pp. 1435-1438. [10.1016/j.mee.2009.11.133]

Emission control of colloidal nanocrystals embedded in Si3N4 photonic crystal H1 nanocavities

Grande, M.;
2010-01-01

Abstract

In this work we report on our recent studies on Silicon-Nitride PhC single-defect nanocavity membranes embedding colloidal nanocrystals. A novel structure consisting of a layer of nanocrystals sandwiched between two layers of Silicon-Nitride has been used. Photoluminescence measurements prove the efficient coupling among the nanoemitters and the optical modes localized in the Si3N4 photonic crystal nanocavities, showing enhancement of the spontaneous emission in resonant conditions. This technology enables the realization of NC-based ultra-small lasers and non-classical light sources operating at visible wavelengths on silicon substrates. © 2009 Elsevier B.V. All rights reserved.
2010
Emission control of colloidal nanocrystals embedded in Si3N4 photonic crystal H1 nanocavities / Qualtieri, A.; Pisanello, F.; Grande, M.; Stomeo, T.; Martiradonna, L.; Epifani, G.; Fiore, A.; Passaseo, A.; De Vittorio, M.. - In: MICROELECTRONIC ENGINEERING. - ISSN 0167-9317. - STAMPA. - 87:5-8(2010), pp. 1435-1438. [10.1016/j.mee.2009.11.133]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/88240
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