This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADC's. Simulation results showed a detection sensitivity on specifications parameters of up to -100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration. © 2006 Elsevier Ltd. All rights reserved.
Fully digital strategy for fast calibration and test of ΣΔ ADC's / DE VENUTO, Daniela; Reyneri, Leonardo. - In: MICROELECTRONICS JOURNAL. - ISSN 0959-8324. - 38:1(2007), pp. 140-147. [10.1016/j.mejo.2006.08.002]
Fully digital strategy for fast calibration and test of ΣΔ ADC's
DE VENUTO, Daniela;
2007-01-01
Abstract
This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADC's. Simulation results showed a detection sensitivity on specifications parameters of up to -100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration. © 2006 Elsevier Ltd. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
