This paper presents a fault analysis applied to a novel optical, label-free sensors array for DNA detection. The inductive fault analysis approach to extract and model the possible defects has been used. A critical equivalent resistance for the possible faults has been defined and it allowed defining the threshold values of current to discriminate the occurrence of the failures mechanisms. Particularly critical is the shorts occurrence: in this failure mode the current changes can generate a wrong information that can be confused with the current reduction due to DNA detection. At the end a test strategy for structural test is proposed.
|Titolo:||Fault diagnosis and Test of DNA sensor arrays by using IFA approach|
|Data di pubblicazione:||2009|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.mejo.2008.01.002|
|Appare nelle tipologie:||1.1 Articolo in rivista|