This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution SD ADCs. Simulation results showed a detection sensitivity on specifications parameters of up to 100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.
|Titolo:||Fully Digital strategy for fast calibration and test of ΣΔ ADCs|
|Data di pubblicazione:||2007|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.mejo.2006.08.005|
|Appare nelle tipologie:||1.1 Articolo in rivista|