This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADCs. Simulations and measurements showed a discrimination threshold on specification parameters up to −90 dBc. The proposed method helps to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based selfcalibration.
|Titolo:||Fast PWM-Based Test for High Resolution Sigma-Delta ADCs|
|Data di pubblicazione:||2007|
|Digital Object Identifier (DOI):||10.1007/s10836-007-5047-x|
|Appare nelle tipologie:||1.1 Articolo in rivista|