This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADCs. Simulations and measurements showed a discrimination threshold on specification parameters up to −90 dBc. The proposed method helps to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based selfcalibration.
Fast PWM-Based Test for High Resolution Sigma-Delta ADCs / DE VENUTO, Daniela; L., Reyneri. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 23:6(2007), pp. 539-548. [10.1007/s10836-007-5047-x]
Fast PWM-Based Test for High Resolution Sigma-Delta ADCs
DE VENUTO, Daniela;
2007-01-01
Abstract
This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADCs. Simulations and measurements showed a discrimination threshold on specification parameters up to −90 dBc. The proposed method helps to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based selfcalibration.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
