Threshold voltage extraction for MOS devices is translated into the easier task of locating a minimum in a derived function of IDS and VGS. The technique, which provided excellent results on both simulated (SPICE) and experimental data, has been tested on several MOSFETs from different processes and has been implemented into an automated tool instead of more costly optimisation based techniques.
|Titolo:||New experimental technique for fast and accurate MOSFET threshold extraction|
|Data di pubblicazione:||1993|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1049/el:19930910|
|Appare nelle tipologie:||1.1 Articolo in rivista|