Corsi, Francesco

Corsi, Francesco  

Dipartimento di Ingegneria Elettrica e dell'Informazione  

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Risultati 1 - 20 di 197 (tempo di esecuzione: 0.028 secondi).
Titolo Data di pubblicazione Autori File
An Efficient Simple Algorithm for the Automatic Synthesis of Fault Trees 1-gen-1978 CORSI, FrancescoCAMARDA, Pietro +
An Efficient Simple Algorithm for Fault Tree Automatic Synthesis from the Reliability Graph 1-gen-1978 P. CamardaF. Corsi +
Optical Fiber Computer Network Design 1-gen-1979 BOZZETTI, MicheleCAMARDA, PietroCORSI, Francesco +
RELIABILITY TEST PLAN FOR A PROTECTIVE EQUIPMENT 1-gen-1979 CORSI, Francesco +
AN AVAILABILITY EVELUATION FOR COMPUTER COMMUNICATION NETWORKS 1-gen-1980 CORSI, Francesco +
NON LINEARLY LOADED INSULATED PROBES FOR THE MEASUREMENT OF ELECTRICAL FIELD DISTRIBUTION IN BIOLOGICAL MEDIA 1-gen-1980 CORSI, FrancescoBOZZETTI, Michele +
Electromagnetic coupling between apertures and biological structures 1-gen-1981 M. BozzettiF. Corsi +
QUEUE LENGHT PDF ESTIMATION IN SLOTTED CHANNEL COMPUTER NETWORKS 1-gen-1982 CORSI, Francesco +
PROBABILISTIC DELAY EVALUATION IN COMBINATIONAL CIRCUITS BY PETRI NETS 1-gen-1983 CORSI, Francesco +
Modelling digital circuits with delays by Stochastic Petri Nets 1-gen-1983 B. CastagnoloF. Corsi
A review of RAM testing methodologies 1-gen-1983 F. Corsi +
Mathematical models for marginal reliability analysis 1-gen-1983 Corsi, Francesco
A MICROPROCESSOR CONTROLLED RELIABLE HIGH PRECISION GONIOMETER 1-gen-1984 CORSI, Francesco +
AN EFFICIENT LOGIC SIMULATOR FOR VLSI CIRCUITS BASED ON PETRI NETS 1-gen-1984 CORSI, Francesco +
COMPUTATIONAL COMPLEXITY OF 2-D IMAGE PROCESSING BY A PARALLEL ARCHITECTURE 1-gen-1984 CORSI, Francesco +
Multistate Markov Models and Structural Properties of the Transition-Rate Matrix 1-gen-1986 Giuseppe CafaroFrancesco CorsiFrancesco Vacca
Evaluation of the Behaviour of Digital Circuits by Timed Petri Nets 1-gen-1986 Castagnolo, B.Corsi, F.
LOGIC TESTABILITY ANALYSIS USING BIPARTITE GRAPHS 1-gen-1987 CORSI, Francesco +
A 2-D FFT PROCESSOR IN 3 UM CMOS TECHNOLOGY 1-gen-1987 CORSI, FrancescoDi Lecce, Vincenzo +
PROBABILISTIC TESTABILITY ANALYSIS OF LOGIC CIRCUITS 1-gen-1987 CORSI, Francesco