The foundations of RAM testing theory are reviewed and several test procedures designed to cover logical faults are examined in the light of experience of problems most frequently encountered. Widely used test patterns, derived on the basis of simple considerations, are analysed within the framework of the above theory. The results of this analysis, summarised in a table, provide a useful guide for the choice of the test patterns to be used for characterisation or volume testing of RAM chips.
|Titolo:||A review of RAM testing methodologies|
|Data di pubblicazione:||1983|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/S0026-2692(83)80222-5|
|Appare nelle tipologie:||1.1 Articolo in rivista|