Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.
Defect level for non-equiprobable faults in digital ICs / Corsi, F.; Del Console, D.; Marzocca, C.. - In: ELECTRONICS LETTERS. - ISSN 0013-5194. - STAMPA. - 29:8(1993), pp. 653-654. [10.1049/el:19930437]
Defect level for non-equiprobable faults in digital ICs
F. Corsi;C. Marzocca
1993-01-01
Abstract
Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.File in questo prodotto:
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