Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.
|Titolo:||Defect level for non-equiprobable faults in digital ICs|
|Data di pubblicazione:||1993|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1049/el:19930437|
|Appare nelle tipologie:||1.1 Articolo in rivista|