Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.

Defect level for non-equiprobable faults in digital ICs

F. Corsi;C. Marzocca
1993

Abstract

Common measures of test efficiency are the fault coverage and the defect level for a given product yield. An extension of the well known formula relating these three quantities to the case of general non-equiprobable faults has been derived by exploiting the concept of critical area. This also leads to a more meaningful definition of fault coverage.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11589/10409
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