The paper illustrates a method for simultaneous ADC and DAC linearity testing in a loopback scheme. The main features of the method are: (i) it is statistically nearly optimal, being based on a maximum likelihood estimator; (ii) it does not require prior knowledge neither of the ADC nonlinearity, nor of the DAC nonlinearity - both are simultaneously measured relying only on a constant-variance noise. The performances of the method are studied both mathematically and via computer simulations. The method, because of its optimality and universality, appears to be also a good candidate for inclusion in technical standards relevant to ADC and DAC testing.
|Titolo:||A Maximum Likelihood Estimator for ADC and DAC Linearity Testing|
|Data di pubblicazione:||2008|
|Nome del convegno:||16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|