The paper illustrates a method for simultaneous ADC and DAC linearity testing in a loopback scheme. The main features of the method are: (i) it is statistically nearly optimal, being based on a maximum likelihood estimator; (ii) it does not require prior knowledge neither of the ADC nonlinearity, nor of the DAC nonlinearity - both are simultaneously measured relying only on a constant-variance noise. The performances of the method are studied both mathematically and via computer simulations. The method, because of its optimality and universality, appears to be also a good candidate for inclusion in technical standards relevant to ADC and DAC testing.

A Maximum Likelihood Estimator for ADC and DAC Linearity Testing / Cavone, Giuseppe; DI NISIO, Attilio; Giaquinto, Nicola; Savino, Mario. - (2008), pp. 1127-1132. (Intervento presentato al convegno 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements tenutosi a Florence, Italy nel September 22-24, 2008).

A Maximum Likelihood Estimator for ADC and DAC Linearity Testing

CAVONE, Giuseppe;DI NISIO, Attilio;GIAQUINTO, Nicola;SAVINO, Mario
2008-01-01

Abstract

The paper illustrates a method for simultaneous ADC and DAC linearity testing in a loopback scheme. The main features of the method are: (i) it is statistically nearly optimal, being based on a maximum likelihood estimator; (ii) it does not require prior knowledge neither of the ADC nonlinearity, nor of the DAC nonlinearity - both are simultaneously measured relying only on a constant-variance noise. The performances of the method are studied both mathematically and via computer simulations. The method, because of its optimality and universality, appears to be also a good candidate for inclusion in technical standards relevant to ADC and DAC testing.
2008
16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
9788890314933
A Maximum Likelihood Estimator for ADC and DAC Linearity Testing / Cavone, Giuseppe; DI NISIO, Attilio; Giaquinto, Nicola; Savino, Mario. - (2008), pp. 1127-1132. (Intervento presentato al convegno 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements tenutosi a Florence, Italy nel September 22-24, 2008).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/14131
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