Today, quality control is a nodal point in many industries, and in the glass one in particular; in most cases the human control does not catch up with the pressing market requirements, therefore computer vision inspection systems are preferable to reduce costs and to improve the product quality, but several problems must be solved. In this paper a prototype system, able to reproduce all the functionalities of an automatic glass inspection system, is designed and realized; it guarantees good results and considerable reliability with low incidence on manufacturing costs. The final in-line computer vision system is under development in cooperation with a specialized electronic industry.

An online defects inspection system for satin glass based on machine vision / Adamo, F.; Attivissimo, F.; Di Nisio, A.; Savino, M.. - (2009), pp. 288-293. (Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference, 2009, I2MTC '09 tenutosi a Singapore nel 5-7 May 2009) [10.1109/IMTC.2009.5168461].

An online defects inspection system for satin glass based on machine vision

Adamo, F.;Attivissimo, F.;Di Nisio, A.;Savino, M.
2009-01-01

Abstract

Today, quality control is a nodal point in many industries, and in the glass one in particular; in most cases the human control does not catch up with the pressing market requirements, therefore computer vision inspection systems are preferable to reduce costs and to improve the product quality, but several problems must be solved. In this paper a prototype system, able to reproduce all the functionalities of an automatic glass inspection system, is designed and realized; it guarantees good results and considerable reliability with low incidence on manufacturing costs. The final in-line computer vision system is under development in cooperation with a specialized electronic industry.
2009
IEEE Instrumentation and Measurement Technology Conference, 2009, I2MTC '09
978-1-4244-3352-0
An online defects inspection system for satin glass based on machine vision / Adamo, F.; Attivissimo, F.; Di Nisio, A.; Savino, M.. - (2009), pp. 288-293. (Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference, 2009, I2MTC '09 tenutosi a Singapore nel 5-7 May 2009) [10.1109/IMTC.2009.5168461].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/14527
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