A loop-back test is illustrated, where the outputs of a DAC are dithered by additive noise and digitized by an ADC. The samples are collected in a code occurrence table, which allows the measurement of the input/outputs characteristics of both the ADC and the DAC. The method is particularly suited for implementing self-calibration strategies. The measurement is performed by means of maximum likelihood estimation and is therefore statistically nearly optimal. After a description of the method, experimental data are illustrated for validating the proposed linearity test.
Loop-back linearity test of ADCs and DACs: Measuring simultaneously ADC and DAC nonlinearities by means of dithering and maximum likelihood estimation / DI NISIO, Attilio; Giaquinto, Nicola; Savino, Mario. - (2009), pp. 856-859. (Intervento presentato al convegno IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2009 tenutosi a Singapore nel 05-07 Maggio 2009) [10.1109/IMTC.2009.5168569].
Loop-back linearity test of ADCs and DACs: Measuring simultaneously ADC and DAC nonlinearities by means of dithering and maximum likelihood estimation
DI NISIO, Attilio;GIAQUINTO, Nicola;SAVINO, Mario
2009-01-01
Abstract
A loop-back test is illustrated, where the outputs of a DAC are dithered by additive noise and digitized by an ADC. The samples are collected in a code occurrence table, which allows the measurement of the input/outputs characteristics of both the ADC and the DAC. The method is particularly suited for implementing self-calibration strategies. The measurement is performed by means of maximum likelihood estimation and is therefore statistically nearly optimal. After a description of the method, experimental data are illustrated for validating the proposed linearity test.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
