A loop-back test is illustrated, where the outputs of a DAC are dithered by additive noise and digitized by an ADC. The samples are collected in a code occurrence table, which allows the measurement of the input/outputs characteristics of both the ADC and the DAC. The method is particularly suited for implementing self-calibration strategies. The measurement is performed by means of maximum likelihood estimation and is therefore statistically nearly optimal. After a description of the method, experimental data are illustrated for validating the proposed linearity test.
|Titolo:||Loop-back linearity test of ADCs and DACs: Measuring simultaneously ADC and DAC nonlinearities by means of dithering and maximum likelihood estimation|
|Data di pubblicazione:||2009|
|Nome del convegno:||IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2009|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/IMTC.2009.5168569|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|