In this paper the use of the Fast Fourier Transform (FFT) test to derive the integral nonlinearity (INL) of A/D converters is examined. The derived INL is a linear combination of Chebyshev polynomials, where the coefficients are the spurious harmonics of the output spectrum. The accuracy of the test is examined theoretically, in simulations and in practical devices, particularly for the critical (and typical) case when sudden jumps are present in the actual INL. The examined methodology appears to be very convenient when the device under test has high resolution (16-20 bits) and a smoothed approximation of the INL is sufficient, as the FFT test is in this case thousands of times faster than the customary histogram test and static nonlinearity test.

FFT test of A/D Converters to determine the integral nonlinearity

ADAMO, Francesco;ATTIVISSIMO, Filippo;GIAQUINTO, Nicola;SAVINO, Mario
2001-01-01

Abstract

In this paper the use of the Fast Fourier Transform (FFT) test to derive the integral nonlinearity (INL) of A/D converters is examined. The derived INL is a linear combination of Chebyshev polynomials, where the coefficients are the spurious harmonics of the output spectrum. The accuracy of the test is examined theoretically, in simulations and in practical devices, particularly for the critical (and typical) case when sudden jumps are present in the actual INL. The examined methodology appears to be very convenient when the device under test has high resolution (16-20 bits) and a smoothed approximation of the INL is sufficient, as the FFT test is in this case thousands of times faster than the customary histogram test and static nonlinearity test.
2001
18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics
0-7803-6646-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/15156
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