In this paper the use of the Fast Fourier Transform (FFT) test to derive the integral nonlinearity (INL) of A/D converters is examined. The derived INL is a linear combination of Chebyshev polynomials, where the coefficients are the spurious harmonics of the output spectrum. The accuracy of the test is examined theoretically, in simulations and in practical devices, particularly for the critical (and typical) case when sudden jumps are present in the actual INL. The examined methodology appears to be very convenient when the device under test has high resolution (16-20 bits) and a smoothed approximation of the INL is sufficient, as the FFT test is in this case thousands of times faster than the customary histogram test and static nonlinearity test.
|Titolo:||FFT test of A/D Converters to determine the integral nonlinearity|
|Data di pubblicazione:||2001|
|Nome del convegno:||18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/IMTC.2001.928911|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|