Microwave detection has a huge number of applications in physics and engineering. It has already been shown that biased spin torque diodes have performance overcoming the CMOS counterpart in terms of sensitivity. In this regard, the spin torque diodes are promising candidates for the next generation of microwave detectors. Here, we show that the optimization of the rectification process based on the injection locking mechanism gives an ultrahigh sensitivity exceeding 200 kV/W with an output resistance below 1 kΩ while maintaining the advantages over other mechanisms such as vortex expulsion or non-linear resonance, to work without a bias magnetic field.

Ultrahigh detection sensitivity exceeding 105 V/W in spin-torque diode / Zhang, Like; Fang, Bin; Cai, Jialin; Carpentieri, Mario; Puliafito, Vito; Garescì, Francesca; Amiri, Pedram Khalili; Finocchio, Giovanni; Zeng, Zhongming. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 113:10(2018), pp. 102401.102401-102401.102401-4. [10.1063/1.5047547]

Ultrahigh detection sensitivity exceeding 105 V/W in spin-torque diode

Carpentieri, Mario;Puliafito, Vito;
2018-01-01

Abstract

Microwave detection has a huge number of applications in physics and engineering. It has already been shown that biased spin torque diodes have performance overcoming the CMOS counterpart in terms of sensitivity. In this regard, the spin torque diodes are promising candidates for the next generation of microwave detectors. Here, we show that the optimization of the rectification process based on the injection locking mechanism gives an ultrahigh sensitivity exceeding 200 kV/W with an output resistance below 1 kΩ while maintaining the advantages over other mechanisms such as vortex expulsion or non-linear resonance, to work without a bias magnetic field.
2018
https://aip.scitation.org/doi/10.1063/1.5047547
Ultrahigh detection sensitivity exceeding 105 V/W in spin-torque diode / Zhang, Like; Fang, Bin; Cai, Jialin; Carpentieri, Mario; Puliafito, Vito; Garescì, Francesca; Amiri, Pedram Khalili; Finocchio, Giovanni; Zeng, Zhongming. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 113:10(2018), pp. 102401.102401-102401.102401-4. [10.1063/1.5047547]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11589/151827
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